The AT32UC3C1128C-AUR is a high-performance, 32-bit AVR microcontroller from Microchip Technology, designed for industrial and automotive applications. This powerful MCU is based on the AVR32 UC core and is well-suited for applications that require significant processing capabilities, flexible connectivity, and low power consumption.
Featuring a maximum operating frequency of 66 MHz, the AT32UC3C1128C-AUR provides a perfect balance between speed and power efficiency. It comes with 128KB of flash memory, which is ample space for storing complex application code, and 32KB of SRAM for efficient data handling and processing.
The microcontroller supports a wide range of peripherals and interfaces, making it highly versatile for various design needs. It includes a full-speed USB device and embedded host, USART, SPI, TWI (I2C), PWM, and ADC channels, among others. These features allow for easy integration with sensors, actuators, communication modules, and other electronic components.
Safety and reliability are critical in industrial and automotive environments, and the AT32UC3C1128C-AUR addresses this with features such as a watchdog timer, brown-out detector, and a temperature sensor. These built-in safety mechanisms help to maintain the integrity and stable operation of the system under adverse conditions.
The microcontroller is also designed with power-saving techniques in mind. It provides multiple power-saving modes, enabling the device to reduce power consumption during idle periods, which is crucial for battery-powered or energy-sensitive applications.
The AT32UC3C1128C-AUR is available in a 64-pin QFN package, which is ideal for space-constrained applications. Additionally, with its extended temperature range, this MCU is robust and can operate reliably in extreme environments, which is often a requirement for automotive and industrial applications.
In summary, the AT32UC3C1128C-AUR from Microchip Technology is a feature-rich, 32-bit microcontroller that offers a powerful combination of performance, connectivity, and reliability for demanding applications.