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Manufacturer Texas Instruments
Win Source Part Number 1129234-54F38DM
Manufacturer Homepage www.ti.com
Popularity Medium
Supply and Demand Status Limited
Ultra Librarian 3D Model Ultra Librarian 54F38DM CAD Model

Description

The Texas Instruments 54F38DM is a high-performance, dual 4-input NAND gate that is part of the 54 series logic family. This integrated circuit (IC) is designed to meet the demanding needs of a wide range of applications, including military and aerospace industries, due to its robustness and reliability. The 54F38DM is characterized by its fast switching speeds and low power consumption, making it an excellent choice for high-speed computing and logic systems.

Key Features

  • Logic Type: Dual 4-Input NAND Gate
  • Operating Voltage Range: Typically 4.5V to 5.5V, which allows for compatibility with standard TTL logic levels.
  • High-Speed Performance: The 54F38DM is designed to operate at high speeds, ensuring quick response times in critical applications.
  • Low Power Consumption: Despite its speed, the device maintains low power consumption, making it suitable for power-sensitive designs.
  • Temperature Range: The device is built to operate over a wide temperature range, typically from -55°C to 125°C, ensuring reliability in extreme conditions.
  • Packaging: The IC is available in a durable, military-grade package that ensures its performance in harsh environments.

Applications

The versatility of the 54F38DM allows it to be used in various applications that require high-speed logic operations. It is particularly well-suited for:

  • Military and aerospace systems where reliability under extreme conditions is crucial.
  • Complex logic circuits in computing and data processing equipment.
  • High-frequency timing circuits and fast control systems.
  • Automated test equipment that demands consistent and reliable performance.

Quality and Reliability

Texas Instruments is known for its commitment to quality and the 54F38DM is no exception. The device meets stringent quality control standards and is subjected to rigorous testing to ensure it meets the high reliability requirements of its intended applications.

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