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AD5520JSTZ

Part No AD5520JSTZ
Manufacturer Analog Devices Inc.
Catalog Specialized ICs
Description Per Pin Parametric Measurement Unit/Source Measure Unit
Datasheet
Sample
Rohs State rohs
ECAD Module
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Categories Integrated Circuits (ICs)
Manufacturer Analog Devices Inc.
Packaging Tray
Type Per-Pin Parametric Measurement Unit (PPMU)
Applications Automatic Test Equipment
Mounting SMD
Package 64-LQFP
Manufacturer Package 64-LQFP (10x10)
RoHS State Request Verification
Win Source Part Number 1136272-AD5520JSTZ
Manufacturer Homepage www.analog.com
Popularity Medium
Supply and Demand Status Limited
Family Name AD5520
Introduction Date September 01, 2003
ECCN EAR99
Country of Origin Philippines
Halogen Free Compliant
Estimated EOL Date 2028
Ultra Librarian 3D Model Ultra Librarian AD5520JSTZ CAD Model

Description

Product Overview: AD5520JSTZ by Analog Devices Inc.

The AD5520JSTZ is a precision instrument from Analog Devices Inc., designed to cater to the demanding requirements of pin electronics and parametric measurement units (PMUs) within semiconductor test systems. This high-performance product is integral for the testing and characterization of semiconductor devices, ensuring they meet the stringent specifications for today’s advanced electronic applications.

Key Features

  • Precision Parametric Measurement: The AD5520JSTZ boasts an impressive level of accuracy for current force and voltage measurements, enabling reliable and precise characterization of semiconductor components.
  • Integrated PMU: With a built-in PMU, this device simplifies the design of test systems by integrating several functions into a single chip, reducing the need for additional components and streamlining the overall system design.
  • High-Speed Operation: Designed for fast switching and high-speed operation, the AD5520JSTZ is capable of keeping pace with rapid testing cycles, thus increasing throughput in production environments.
  • Versatility: The product supports a range of functions such as force voltage/measure current (FVMI), force current/measure voltage (FIMV), and high impedance modes, offering versatility for different testing scenarios.
  • Programmable Levels: Users can program voltage levels and current limits, providing flexibility to adapt to various test requirements and device specifications.

Applications

The AD5520JSTZ is ideally suited for use in semiconductor test equipment, including but not limited to:

  • Automatic Test Equipment (ATE)
  • Device Characterization
  • SoC and Mixed-Signal Testing
  • Memory Testing

Technical Specifications

With an operating temperature range from -40°C to +85°C and packaged in a compact LQFP-48 form factor, the AD5520JSTZ is both robust and space-efficient. It supports a wide power supply range, ensuring compatibility with various test system configurations.

The AD5520JSTZ from Analog Devices Inc. is a testament to the company's commitment to providing high-quality, reliable solutions for the semiconductor testing industry. By integrating multiple functions and ensuring high precision and speed, this product stands as a crucial component in the realm of electronic test and measurement.

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Pricing & Ordering

Quantity Unit Price Ext. Price
1+ $59.2133 $59.2133
3+ $48.5853 $145.7559
4+ $47.0670 $188.2680
5+ $45.5487 $227.7435
6+ $44.0304 $264.1824
8+ $39.4755 $315.8040
* Prices exclude shipping and taxes. Shipping costs are calculated at checkout.
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Availability: 938 pieces
Order Increment : 1 pcs
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