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SN74ABTH18646APM

Part No SN74ABTH18646APM
Manufacturer Texas Instruments
Catalog Logic - Specialty Logic
Description SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | IC SCAN-TEST-DEV/TXRX 64-LQFP
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Categories Integrated Circuits
Manufacturer Texas Instruments
Packaging Tray
Logic Type Scan Test Device With Transceivers And Registers
Supply Voltage 4.5V ~ 5.5V
Resolution 18
Temperature Range - Operating -40°C ~ 85°C
Mounting Style SMD
Manufacturer Package 64-LQFP
Supplier Device Package 64-LQFP
Family Part Number 74ABTH18646
Manufacturer Pack Quantity 160
MSL Level 3 (168 Hours)
Win Source Part Number 1253205-SN74ABTH18646APM
Manufacturer Homepage www.ti.com
Popularity Medium
Supply and Demand Status Limited
Ultra Librarian 3D Model Ultra Librarian SN74ABTH18646APM CAD Model

Description

SN74ABTH18646APM Scan Test Device with 18-Bit Bus Transceivers and Registers

The SN74ABTH18646APM is a high-performance integrated circuit from Texas Instruments, designed to meet the demands of high-speed data transfer and signal processing applications. This versatile component features 18-bit bus transceivers and registers, making it an ideal choice for systems that require efficient communication and data manipulation capabilities.

Key Features:

  • High-Speed Data Transfer: The device supports bidirectional data flow, ensuring rapid data transmission that is essential for modern digital applications.
  • Scan Test Capabilities: Equipped with scan test features, the SN74ABTH18646APM allows for easy implementation of boundary-scan test methodologies, simplifying the testing and debugging processes.
  • Multiple Configurations: The device can be configured as two 9-bit bus transceivers or one 18-bit bus transceiver, offering flexibility to adapt to different system architectures.
  • Edge-Rate Control: It includes edge-rate control circuitry that minimizes noise generation, ensuring clean and stable signal transitions.
  • Live Insertion and Extraction: The SN74ABTH18646APM supports live insertion and extraction, reducing system downtime during upgrades or maintenance.

Applications:

The SN74ABTH18646APM is suitable for a variety of applications, particularly those requiring high-speed data buses and interface connectivity. It is commonly used in:

  • Telecommunications equipment
  • Servers and networking hardware
  • Industrial control systems
  • Data acquisition systems
  • Test and measurement instruments

Technical Specifications:

  • Logic Family: ABT
  • Logic Type: Scan Test Devices with 18-Bit Bus Transceivers and Registers
  • Supply Voltage: 2.7V to 3.6V
  • Operating Temperature: -40°C to 85°C
  • Package: LQFP-56

The SN74ABTH18646APM by Texas Instruments is a testament to the company's dedication to producing high-quality, reliable components for the most demanding electronic systems. With its advanced features and robust performance, it stands as a top choice for designers and engineers looking to create efficient and high-performing products.

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Pricing & Ordering

Quantity Unit Price Ext. Price
4+ $15.8644 $63.4576
8+ $13.0169 $104.1352
12+ $12.6101 $151.3212
17+ $12.2034 $207.4578
22+ $11.7966 $259.5252
29+ $10.5763 $306.7127
* Prices exclude shipping and taxes. Shipping costs are calculated at checkout.
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Availability: 1,830 pieces
MOQ: 4 pcs
Order Increment : 1 pcs
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