ON Semiconductor CAT93C76VI-GT3 EEPROM
The CAT93C76VI-GT3 is a robust, high-performance 16-Kb Serial EEPROM memory chip from ON Semiconductor, designed for a wide range of applications requiring a reliable data storage solution. This device is particularly well-suited for sophisticated industrial, automotive, and consumer electronics where long-term data retention and data integrity are critical.
Featuring a versatile serial interface, the CAT93C76VI-GT3 allows for easy integration into various microcontroller-based systems. It operates over a wide voltage range of 2.5V to 5.5V, making it adaptable to both low-power and standard applications. The device's small form factor is encapsulated in an 8-pin TSSOP package, ensuring a minimal footprint on printed circuit boards and compatibility with compact device designs.
Key specifications of the CAT93C76VI-GT3 include:
- Memory Size: 16-Kb (2 K x 8 or 1 K x 16)
- Interface Type: Serial Microwire
- Operating Voltage Range: 2.5V to 5.5V
- Package: 8-pin TSSOP (GT3)
- Temperature Range: -40°C to +85°C
- Organisation: 2 K x 8 or 1 K x 16 user-selectable
The device boasts a self-timed write cycle with auto-clear, simplifying the write operation and ensuring data is correctly stored without the need for external timers. Additionally, the CAT93C76VI-GT3 supports up to 1 million write cycles and a data retention period of 100 years, providing a reliable storage solution over the product's lifetime.
ON Semiconductor's CAT93C76VI-GT3 EEPROM also features a write protection mechanism, including both hardware and software options, to prevent accidental data alteration. This is particularly important in applications where the integrity of settings or calibration data must be maintained.
In summary, the CAT93C76VI-GT3 from ON Semiconductor is a high-quality, durable EEPROM memory chip, offering a mix of high-density storage, low-power consumption, and a compact package. It is an excellent choice for designers looking to implement non-volatile memory in their systems with confidence in data security and reliability.