Product Overview: 74HCT174D by NXP
The 74HCT174D from NXP Semiconductors is a high-speed Si-gate CMOS device that falls within the 74HCT family. This integrated circuit is particularly designed to offer the functionality of the 74HC174 and 74HCT174 logic chips. It is characterized by its high noise immunity and low power consumption, making it a suitable choice for a wide range of digital applications.
Key Features
- Hex D-type Flip-Flop: The 74HCT174D contains six D-type flip-flops with clear inputs, providing synchronous state storage for systems requiring multiple latching elements.
- Positive-edge Triggering: Each flip-flop is triggered by a positive-edge signal, ensuring precise timing for state changes in digital circuits.
- Direct Clear Input: The clear input allows for the immediate resetting of all six flip-flops, which is essential for initializing states or emergency resets.
- Standard Pin Configuration: The device comes in a standard SO-16 package, which is compatible with surface mount techniques, making it easy to integrate into various PCB designs.
- Compatibility: The 74HCT174D is TTL compatible when operating at VCC from 4.5V to 5.5V, allowing for seamless integration with older TTL logic circuits while benefiting from CMOS technology's lower power consumption.
Applications
The versatility of the 74HCT174D makes it suitable for a broad spectrum of applications, including:
- Control systems
- Logic buffers
- Register storage
- Counters and dividers
- State machines
Technical Specifications
Attribute
Value
Package Type
SO-16
Supply Voltage
4.5V to 5.5V
Operating Temperature
-40°C to +125°C
Logic Family
74HCT
Logic Function
Flip-Flop
The 74HCT174D represents NXP's commitment to providing robust and reliable logic devices that meet the evolving needs of modern digital systems. Its combination of high-speed operation, low power consumption, and compatibility with existing logic families makes it an excellent choice for designers looking to add efficient latching mechanisms to their electronic projects.
