The SN74LVTH18514DGGR is a high-performance, 3.3-V ABT Scan Test Device with 20-Bit Bus-Interface Flip-Flops designed and manufactured by Texas Instruments. This integrated circuit is part of the LVTH family, known for its low-voltage, high-speed operation and compatibility with mixed-voltage systems.

Key Features

• Technology: BiCMOS technology provides optimized power consumption and speed performance.
• Voltage Range: Operates from a 3.3 V ± 0.3 V supply, ensuring compatibility with lower voltage systems and enabling power-efficient designs.
• Bus Interface Flip-Flops: Features 20-bit flip-flops with a bus interface, allowing for efficient data storage and transfer.
• Scan Test Devices: Incorporated scan test devices with boundary scan (IEEE Std 1149.1-1990) capabilities facilitate testing of integrated circuits and systems.
• High Drive: Provides high-drive outputs (-32 mA IOH, 64 mA IOL) to drive heavy loads or multiple outputs simultaneously.
• Package: Available in a TSSOP (Thin Shrink Small Outline Package) with 48 pins, providing a compact footprint for space-constrained applications.

Applications

The SN74LVTH18514DGGR is suitable for a variety of applications, particularly where low-voltage operation and high-speed data handling are required. It is ideal for:

• Memory address and data interfacing
• Communication systems
• Data processing
• Server and enterprise solutions
• Embedded systems

Quality and Reliability

Texas Instruments is renowned for its commitment to quality and reliability. The SN74LVTH18514DGGR is no exception and is built to meet or exceed industry standards. With Texas Instruments' rigorous testing and quality assurance, customers can trust in the performance and longevity of this product.

Ordering Information

The product is available for order under the part number SN74LVTH18514DGGR. For detailed specifications, technical documents, and ordering information, please visit the Texas Instruments official website or contact their sales representatives.

Note: The information provided here is subject to change and may be updated as new product revisions occur.