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SCAN18541TSSC

Part No SCAN18541TSSC
Manufacturer ON Semiconductor
Catalog Logic - Buffers, Drivers, Receivers, Transceivers
Description IC BUF NON-INVERT 5.5V 56SSOP / Buffer, Non-Inverting 2 Element 9 Bit per Element 3-State Output 56-SSOP
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Category Integrated Circuits (ICs)>Logic - Buffers, Drivers, Receivers, Transceivers
Mfr onsemi
Series 18000
Package Tube
Product Status Obsolete
Logic Type Buffer, Non-Inverting
Number of Elements 2
Number of Bits per Element 9
Output Type 3-State
Current - Output High, Low 32mA, 64mA
Voltage - Supply 4.5V ~ 5.5V
Temperature Range - Operating -40°C ~ 85°C (TA)
Mounting SMD (SMT)
Package / Case 56-BSSOP (0.295", 7.50mm Width)
Supplier Device Package 56-SSOP
Base Product Number SCAN18
Standard Package 25
MSL Level 1 (Unlimited)
REACH Status REACH Unaffected
ECCN EAR99
HTSUS 8542.39.0001
Win Source Part Number 1260215-SCAN18541TSSC
Ultra Librarian 3D Model Ultra Librarian SCAN18541TSSC CAD Model

Description

ON Semiconductor SCAN18541TSSC: A Robust Low-Voltage CMOS Shift Register

The SCAN18541TSSC is a versatile and high-performance CMOS shift register designed by ON Semiconductor, a leading semiconductor supplier known for its innovative and energy-efficient solutions. This particular component is part of ON Semiconductor's expansive portfolio of logic products and is designed to meet the demanding requirements of modern digital systems.

The SCAN18541TSSC operates at a low voltage range, making it suitable for battery-powered and portable devices where power efficiency is crucial. With its 3.3V to 5V operating voltage, it provides designers with the flexibility to use it in systems with varying power supplies while maintaining a low power consumption profile.

Featuring a 10-bit serial-in, parallel-out configuration, the SCAN18541TSSC allows for the serial input of data, which is then converted to a parallel output. This makes it an ideal solution for applications requiring data conversion or for expanding the number of output lines in a system. The shift register is capable of handling high-speed data transfer, ensuring quick and reliable communication within the device.

One of the key features of the SCAN18541TSSC is its built-in scan test capability, which complies with IEEE Standard 1149.1. This JTAG boundary scan feature enables testing of the interconnections on printed circuit boards (PCBs) without using physical test probes, simplifying the testing process and ensuring the integrity of the product during manufacturing.

Constructed with the high-quality standards expected from ON Semiconductor, the SCAN18541TSSC is encapsulated in a TSSOP (Thin Shrink Small Outline Package) form factor. This compact package is suitable for space-constrained applications while providing excellent thermal performance and reliability.

In summary, the SCAN18541TSSC from ON Semiconductor is a reliable and efficient solution for designers looking to incorporate a low-voltage shift register with scan test capabilities into their digital systems. Its high-speed operation, low power consumption, and compact packaging make it a smart choice for a wide range of applications, including computing, consumer electronics, and industrial automation.

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