ON Semiconductor MC33164D-5G Voltage Supervisor IC
The ON Semiconductor MC33164D-5G is a precision voltage supervisor integrated circuit designed to monitor voltage levels in a wide range of electronic applications. This device is particularly critical in systems where voltage fluctuations can lead to improper operation, data loss, or even damage to electronic components. The MC33164D-5G ensures that these systems remain within their specified voltage thresholds, thus enhancing reliability and performance.
Key Features
- Voltage Threshold: The device features a preset threshold voltage of 5V, which is ideal for monitoring 5V power supply systems.
- Reset Timeout: It offers a significant delay time of approximately 140 ms, providing a reliable reset signal and preventing premature system restarts during transient conditions.
- Low Power Consumption: With its low power design, the MC33164D-5G minimizes the impact on the overall power budget of the system, making it suitable for power-sensitive applications.
- Operating Temperature Range: It operates over a wide temperature range from -40°C to +85°C, ensuring stability across various environmental conditions.
- Package: The device comes in an 8-pin SOIC package, which is compact and suitable for space-constrained applications.
- Output Type: It features an active-low, open-drain reset output, which allows for simple interfacing with other logic components.
Applications
The MC33164D-5G is versatile and can be used in a variety of applications, including:
- Microprocessor and microcontroller systems
- Portable/battery-powered equipment
- Industrial controllers
- Automotive systems
- Telecommunication and networking devices
- Computers and storage systems
With its precision monitoring and low power consumption, the MC33164D-5G from ON Semiconductor is an excellent choice for systems that require robust voltage supervision to maintain operational integrity. Its ease of integration and reliable performance make it a go-to choice for engineers looking to enhance the safety and dependability of their electronic designs.