The 27C256-20FA is a high-performance, 256 Kilobit (32K x 8) UV erasable and programmable read-only memory (EPROM) device from NXP Semiconductors. This EPROM is designed to offer a flexible and cost-effective solution for firmware storage and data retention in a wide array of electronic applications. It is particularly well-suited for applications requiring storage and retrieval of critical data where reliability and stability are of paramount importance.
Key Features
- Memory Size: The device comes with a substantial 256K-bit storage capacity, providing ample space for system boot code, user programs, or data tables.
- Access Time: With an access time of 200 nanoseconds, the 27C256-20FA allows for swift data retrieval, enhancing overall system performance.
- Programming Voltage: The device supports a programming voltage of 12.5V, which is a standard requirement for programming EPROM devices.
- Single +5V Power Supply: It operates on a single +5V power supply, making it compatible with most digital systems and simplifying power management.
- Extended Temperature Range: The 27C256-20FA is designed to operate over an extended temperature range, making it suitable for industrial applications.
- Package: Available in a 28-pin Ceramic Dual In-line Package (CerDIP), it provides robust physical protection and reliable connectivity for the embedded components.
Applications
The NXP 27C256-20FA is ideal for use in a variety of applications that require reliable, non-volatile memory storage. These applications include:
- Embedded systems and microcontroller-based applications
- Automotive electronics
- Industrial control systems
- Telecommunication infrastructure
- Medical devices
- Consumer electronics
Quality and Reliability
NXP Semiconductors is known for its commitment to quality and reliability, and the 27C256-20FA is no exception. Each device undergoes rigorous testing to ensure it meets the industry standards for performance and durability. This makes the 27C256-20FA a trusted choice for developers and engineers looking for a memory solution that will stand the test of time.
