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Category IT infrastructure Memory
Win Source Part Number 1455626-24CS512T-E/SN
Manufacturer Microchip Technology
Package Tape & Reel (TR);Cut Tape (CT)
Product Status Active
Memory Type Non-Volatile
Memory Format EEPROM
Technology EEPROM
Memory Size 512Kbit
Memory Organization 64K x 8
Memory Interface I2C
Clock Frequency 3.4MHz
Write Cycle Time - Word, Page 5ms
Access Time 400ns
Voltage - Supply 1.7V ~ 5.5V
Operating Temperature -40°C ~ 125°C (TA)
Grade -
Mounting Type Surface Mount
Package / Case 8-SOIC (0.154", 3.90mm Width)
Supplier Device Package 8-SOIC
Ultra Librarian 3D Model Ultra Librarian 24CS512T-E/SN CAD Model

Description

The 24CS512T-E/SN EEPROM by Microchip is a robust memory solution designed to meet the needs of complex electronic systems requiring non-volatile storage. With a capacity of 512Kbits, it allows for the storage of large datasets such as configuration parameters, device calibration data, or user preferences. This model operates over the I2C serial interface at a frequency of 3.4MHz, delivering fast access speeds crucial for applications where data retrieval and storage efficiency are paramount. Ideal for environments subject to extreme temperatures, the 'E' series signifies its enhanced resilience, making it an optimal choice for industrial and outdoor applications. The integration of EEPROM technology means that data can be erased and rewritten electrically, providing flexibility and ease of updating stored information without physical replacement. Packaged in an 8-pin SOIC, the 24CS512T-E/SN supports surface mount technology (SMT) production methods, facilitating compact and reliable circuit design. Its low power consumption and high endurance characteristics extend its suitability to battery-operated devices, automation systems, and sophisticated IoT devices where reliability over frequent operations is essential. Microchip's emphasis on compatibility and performance makes this EEPROM a go-to component for developers seeking a mix of capacity, endurance, and operational reliability under challenging conditions.

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