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AM29F400AB-150EI

Part No AM29F400AB-150EI
Manufacturer Amd
Catalog OEM Parts (A - B)
Description Contact for details
Sample
Rohs State Need to verify
ECAD Module
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RoHS Non-Compliant
Win Source Part Number 1044637-AM29F400AB-150EI
Categories OEM Parts(A-B)
Manufacturer Amd
Popularity Low
Supply and Demand Status Shortage
Ultra Librarian 3D Model Ultra Librarian AM29F400AB-150EI CAD Model

Description

The AM29F400AB-150EI is a 4 Mbit (512K x 8-bit) CMOS 5.0 Volt-only Flash memory manufactured by AMD. This device is designed for use in applications that require in-system programmability and low power consumption. It offers reliable data storage and quick access times.

Applications

  • Embedded systems
  • Industrial control systems
  • Networking devices
  • Consumer electronics
  • Telecommunications equipment

Features

  • 4 Mbit Flash memory
  • Organized as 512K x 8 bits
  • 5.0 Volt-only operation
  • Sector Erase architecture
  • Access time of 150 ns

Benefits

  • Non-volatile data storage
  • In-system programmability
  • Low power consumption
  • Fast data access
  • Reliable data retention

The AM29F400AB-150EI features a sector erase architecture, allowing individual sectors to be erased and reprogrammed without affecting the rest of the memory. The device is specifically designed to operate with a single 5.0 Volt power supply, thus simplifying system design and also reducing power consumption. The access time of 150 ns allows the AM29F400AB-150EI to provide rapid data access, enhancing system performance. The flash memory is organized as 512K x 8 bits, giving ample space for data storage. Its design ensures high levels of endurance and reliability, allowing for long-term data retention and reduction in data loss. The device includes internal protection to prevent accidental data corruption and unauthorized access. It is commonly used to store critical data such as boot code and configuration settings in embedded systems. Specific components used in manufacture are selected to maximize performance and reliability under various conditions.

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