Product Overview: TPS3801J25DCKR
The TPS3801J25DCKR is a high-precision voltage detector designed and manufactured by Texas Instruments, a leader in semiconductor solutions. This compact and efficient component is an essential building block for power management and monitoring applications, where reliable voltage supervision is crucial for system stability and performance.
Key Features
- Voltage Threshold: The device features a fixed-sense threshold voltage of 2.5V, making it suitable for monitoring 2.5V power supplies.
- High Accuracy: It offers a high threshold accuracy of ±1.5%, ensuring precise voltage detection and system reliability.
- Low Power Consumption: With a quiescent current of only 6.5 µA, the TPS3801J25DCKR is optimized for battery-powered and energy-sensitive applications.
- Reset Time Delay: The built-in programmable time delay function provides flexibility, allowing designers to set the appropriate response time for their system requirements.
- Supply Voltage Range: The device operates over a wide supply voltage range from 1.1V to 5.5V, accommodating various application needs.
- Output Type: It comes with an open-drain output, which supports the connection of multiple devices to a common reset line for simultaneous system monitoring.
- Temperature Range: The operating temperature range of -40°C to +85°C ensures stable operation across diverse environmental conditions.
- Package: The TPS3801J25DCKR is available in a compact, 5-pin SC-70 package, which is suitable for space-constrained applications.
Applications
The versatility of the TPS3801J25DCKR makes it an ideal choice for a wide range of applications, including:
- Battery-powered devices
- Portable and handheld equipment
- Microprocessor, microcontroller, or FPGA power monitoring
- Industrial and automotive systems
- Networking and telecommunication infrastructure
With its precise voltage monitoring capabilities and Texas Instruments' reputation for quality, the TPS3801J25DCKR is a reliable solution for designers seeking to enhance the safety and robustness of their electronic systems.