The SCANSTA112VS is a high-performance, versatile diagnostic and debugging device from Texas Instruments, one of the leading manufacturers in the semiconductor industry.

• Features: Seven independent JTAG Test Access Ports (TAPs), high-speed, 16-bit parallel interface
• Diagnostic Capabilities: On-chip analog-to-digital converter (ADC) for real-time voltage monitoring
• Voltage Support: Wide range of voltage levels
• Operating Frequency: Up to 50 MHz TCK frequencies
• Features: Programmable watchdog timer
• Physical Characteristics: Compact and lightweight