Product Overview: LP3470IM5X-2.93 Voltage Supervisor from Texas Instruments
The LP3470IM5X-2.93 is a highly precise microprocessor supervisory circuit designed by Texas Instruments to maintain system integrity in digital and mixed-signal systems. This voltage supervisor ensures that the microprocessor, or other critical system voltages, are powered up and down properly, making it an essential component for a wide range of electronic applications.
Key Features:
- Voltage Threshold: The device features a fixed-sense threshold voltage of 2.93V, which is ideal for monitoring 3.3V power supplies and other voltage rails close to this value.
- Reset Timeout Delay: It includes a built-in delay timer that provides a reset signal, ensuring the system has adequate time to stabilize before normal operation resumes.
- Low Power Consumption: The LP3470IM5X-2.93 is designed for low power consumption, making it suitable for battery-powered and portable devices.
- Output Type: It offers an active-low, open-drain reset output, which can be easily interfaced with other logic components.
- Temperature Range: This device operates over a wide temperature range, making it versatile for various environmental conditions.
- Small Footprint: Housed in a compact SOT-23 package, the LP3470IM5X-2.93 is perfect for space-constrained applications.
Applications:
The LP3470IM5X-2.93 is suitable for a diverse set of applications, including:
- Portable Electronics
- Microprocessor/Microcontroller Systems
- Data Storage Devices
- Embedded Systems
- Industrial Controls
Reliability and Support:
As a product of Texas Instruments, the LP3470IM5X-2.93 is backed by a commitment to quality and reliability. Texas Instruments provides comprehensive technical support and documentation, ensuring that designers can integrate this voltage supervisor into their systems with confidence.
Overall, the LP3470IM5X-2.93 from Texas Instruments is a reliable and efficient solution for system voltage supervision, providing protection and stability to enhance the performance and longevity of electronic systems.