The CD74HCT4051M96G4 is a high-performance, CMOS logic-level analog multiplexer/demultiplexer integrated circuit brought to you by Texas Instruments. This versatile component is part of the HCT family and is designed to work with a wide range of digital systems, offering a mix of high-speed operation and low power consumption.
Key Features
- Logic Family: HCT (High-Speed CMOS)
- Number of Channels: 8 (1-of-8)
- Configuration: Single 8-channel multiplexer/demultiplexer
- Operating Voltage: 4.5V to 5.5V
- Propagation Delay Time: 13 ns (typical) at 4.5V
- Package: SOIC-16
- Temperature Range: -55°C to 125°C
- Logic Level - Low: 0.8V max at 4.5V
- Logic Level - High: 2V min at 4.5V
Product Description
The CD74HCT4051M96G4 is an 8-channel digital multiplexer/demultiplexer that allows digital or analog signals to be routed to one output line, making it an essential component for various signal routing applications. Its high-speed CMOS technology ensures that the device is compatible with TTL levels and can operate at a wide range of voltages, providing flexibility for interfacing with various logic families.
The device's low "ON" resistance and low "OFF" leakage current ensure efficient signal handling, making it suitable for applications such as data acquisition systems, signal routing in communication devices, and analog-to-digital conversion systems. Its bidirectional switches allow signals to pass in both directions, adding to the versatility of the device.
The CD74HCT4051M96G4 is offered in a SOIC-16 package, which is compact and suitable for space-constrained applications. The wide operating temperature range allows for use in extreme environments, ensuring reliability and performance stability across various applications. Its low power consumption and fast propagation delay are critical for high-speed digital systems that require efficient power management.
Applications
- Data acquisition systems
- Analog and digital multiplexing
- Signal routing in communication devices
- Analog-to-digital conversion systems
- Test equipment and instrumentation