The CAT93C46UI-26490T is a high-performance, serial EEPROM memory device from ON Semiconductor, a leading manufacturer in the semiconductor industry. This product is designed to provide efficient non-volatile data storage for a wide range of applications. With its robust feature set and compact design, it is an ideal choice for designers looking for a reliable memory solution.

Key Features

• Memory Size: The CAT93C46UI-26490T offers 1-Kb of memory, which is organized as 64 x 16-bit registers, suitable for storing configuration settings, calibration data, or small application parameters.
• Interface: This device uses the industry-standard 3-wire serial interface, ensuring compatibility with a wide range of microcontrollers and processors.
• Operating Voltage: It operates at a voltage range of 2.5V to 5.5V, making it versatile for both low-power and standard applications.
• Operating Temperature: The EEPROM is designed to work reliably over an industrial temperature range of -40°C to +85°C, ensuring performance in harsh conditions.
• Write Cycle Time: It features a fast write cycle time of 5 ms, allowing for quick updates to stored data.
• Endurance: The device boasts an endurance of 1 million write cycles, which guarantees a long operational lifespan for applications that require frequent data changes.
• Data Retention: With a data retention period of 100 years, the CAT93C46UI-26490T ensures that data remains safe and intact over an extended period.

Applications

The CAT93C46UI-26490T is well-suited for a variety of applications, including but not limited to:

• Portable electronic devices
• Automotive systems
• Industrial control systems
• Medical devices
• Smart cards

Quality and Reliability

ON Semiconductor is committed to delivering high-quality and reliable products. The CAT93C46UI-26490T is manufactured under strict quality control standards, ensuring it meets the rigorous demands of the electronics industry. When choosing this EEPROM, designers can be confident in a product that will perform consistently over time and under varying environmental conditions.