The SCANSTA112VS/NOPB is an advanced diagnostic and debugging device manufactured by Texas Instruments, a renowned leader in semiconductor solutions.

• Function: Mixed Signal Scan Bridge, enables boundary scan test access to non-scan components
• Standards: IEEE 1149.1 (JTAG) and IEEE 1149.6 (AC JTAG)
• Features: Eight configurable I/O channels, two dedicated input channels, enhanced at-speed BIST engine
• Diagnostic Capabilities: Built-in self-test (BIST) function
• Power Efficiency: Single 3.3V power supply, low-power sleep mode
• Package: Compact 48-pin TSSOP
• Temperature Range: -40°C to 85°C