The BQ76PL455ATPFCTQ1 is a state-of-the-art integrated circuit designed and manufactured by Texas Instruments. This advanced device is specifically crafted for automotive and industrial battery management systems, with a focus on high-reliability and precision monitoring of multi-cell lithium-ion battery stacks.
Key Features
- Cell Monitoring: Capable of monitoring up to 16 series-connected battery cells, the BQ76PL455ATPFCTQ1 provides accurate voltage and temperature measurements, ensuring safe and efficient operation of the battery pack.
- Balancing and Protection: The device includes integrated balancing transistors and protection features for overvoltage, undervoltage, and overtemperature conditions, helping to maintain battery health and longevity.
- Communication Interface: It supports a robust isolated communication interface, which allows for the stacking of multiple devices in series without compromising signal integrity, enabling the monitoring of large battery stacks.
- High-Voltage Capability: Designed to withstand automotive voltage requirements, the BQ76PL455ATPFCTQ1 can tolerate voltages up to 65V, making it suitable for high-voltage battery management applications.
- Robust Design: The device is engineered to meet the rigorous standards of the automotive industry, including AEC-Q100 qualification, and is available in a 64-pin HTQFP package that ensures reliable performance in harsh environments.
Applications
The BQ76PL455ATPFCTQ1 is ideal for a variety of applications, including:
- Electric and hybrid vehicles
- Energy storage systems
- Back-up power systems
- Industrial power tools
Technical Specifications
| Parameter |
Value |
| Cell Voltage Measurement Range |
0.5V to 5V |
| Operating Temperature Range |
-40°C to +105°C |
| Package Type |
64-pin HTQFP |
| Communication Interface |
Isolated Differential UART |
With its robust design and advanced features, the BQ76PL455ATPFCTQ1 from Texas Instruments is an unparalleled solution for sophisticated battery management systems that demand high accuracy, reliability, and scalability.