The S-80814ANNP-EDB-T2 is a voltage detector IC manufactured by SII Semiconductor Corporation. It is designed to monitor power supply voltages and issue a reset signal when the voltage drops below a specified threshold. This function is critical for preventing malfunctions and data corruption in microprocessor-based systems and other electronic devices.

Applications

• Microcontroller and microprocessor reset circuits
• Power supply monitoring
• Battery-powered devices
• Portable electronics
• Industrial control systems

Features

• Detection voltage: 1.4V (typical)
• High-precision voltage detection
• Ultra-low current consumption
• Hysteresis characteristics to prevent chattering
• Compact SOT-23-3 package
• N-channel open drain output

Benefits

• Prevents system errors and data corruption due to undervoltage conditions.
• Prolongs battery life in portable devices.
• Ensures stable system operation by eliminating false resets.
• Saves board space in compact designs.
• Provides a reliable reset signal for various digital circuits.

Additional Details

The S-80814ANNP-EDB-T2 features a detection voltage of 1.4V, offering precise monitoring of the supply voltage. The IC's ultra-low current consumption is a significant advantage for battery-operated devices, as it helps to extend battery life. The built-in hysteresis characteristic prevents the output signal from oscillating or chattering when the input voltage is near the detection threshold, thereby ensuring stable and reliable system operation. The SOT-23-3 package allows for easy integration into space-constrained applications. The N-channel open drain output configuration provides flexibility in interfacing with different types of microcontrollers and digital circuits. This voltage detector is ideal for safeguarding microcontrollers and other sensitive components from damage or malfunction due to voltage drops, making it an essential component in various electronic systems. By providing a clean and reliable reset signal, the S-80814ANNP-EDB-T2 contributes to the overall stability and reliability of the device.