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S-80833ANNP-EDX-T2

Part No S-80833ANNP-EDX-T2
Manufacturer SII Semiconductor Corporation
Catalog PMIC - Supervisors
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ECAD Module
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Manufacturer SII Semiconductor Corporation
Category Integrated Circuits(ICs)
Family PMIC - Supervisors
Win Source Part Number 186800-S-80833ANNP-EDX-T2
Popularity Low
Supply and Demand Status Balance
Ultra Librarian 3D Model Ultra Librarian S-80833ANNP-EDX-T2 CAD Model

Description

The S-80833ANNP-EDX-T2 is a voltage detector manufactured by SII Semiconductor Corporation. This component is designed to monitor voltage levels in electronic circuits and provide a reset signal when the voltage falls below a certain threshold. It is commonly used in various electronic devices to ensure stable operation and prevent malfunctions caused by voltage fluctuations.

Applications

  • Microcontroller reset circuits
  • CPU voltage monitoring
  • Power management systems
  • Battery-powered devices
  • Industrial control equipment

Features

  • Detection voltage: 3.3V
  • High-precision detection voltage
  • Ultra-low current consumption
  • Small package size
  • Built-in hysteresis
  • Open drain output

Benefits

  • Prevents system malfunctions due to voltage drops.
  • Ensures reliable system startup after a power failure.
  • Extends battery life in portable devices.
  • Simplifies circuit design with integrated functionality.
  • Provides stable and accurate voltage monitoring.
  • Helps to protects sensitive components from undervoltage conditions.

Additional Details

The S-80833ANNP-EDX-T2 features a typical detection voltage of 3.3V. It offers very low current consumption which is crucial for battery operated applications. The open drain output allows flexible configuration with external pull-up resistors. The built-in hysteresis prevents chattering or oscillations around the threshold voltage, ensuring a clean and stable reset signal. The small package makes it suitable for high-density circuit boards. The device operates over a wide temperature range, making it suitable for a variety of environments.

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