The S-80814ALNP-EAB-T2 is a voltage detector manufactured by SII Semiconductor Corporation. This device is designed to monitor voltage levels in electronic circuits and trigger a reset signal when the voltage falls below a specified threshold. Its primary function is to protect sensitive components from damage due to undervoltage conditions.

Applications

• Microcontroller reset circuits
• CPU voltage monitoring
• Power management systems
• Battery-powered devices
• Industrial control equipment

Features

• Detection voltage: 1.4V (typical)
• High-accuracy detection voltage
• Ultra-low current consumption
• Small package size (SOT-23-3)
• Built-in hysteresis characteristics
• Output form: N-channel open drain

Benefits

• Prevents system malfunction due to low voltage
• Extends battery life in portable devices because of its low current consumption.
• Simplifies circuit design due to integrated features.
• Saves board space thanks to its compact package.
• Improves system reliability by providing a reliable reset signal.

Additional Details

The S-80814ALNP-EAB-T2 operates with a typical detection voltage of 1.4V. The built-in hysteresis prevents chattering or oscillations around the threshold voltage, ensuring stable operation. It comes in a small SOT-23-3 package, making it suitable for space-constrained applications. The device features an N-channel open drain output, allowing for flexible interfacing with various microcontrollers and other digital circuits. The ultra-low current consumption is particularly beneficial in battery-powered applications, where minimizing power drain is crucial. The high-accuracy detection voltage ensures precise voltage monitoring, leading to more reliable system protection. This voltage detector is designed to provide a reset signal when the supply voltage drops below the specified detection voltage, preventing the microcontroller or other digital circuitry from operating incorrectly. It offers a simple and reliable solution for voltage monitoring and reset functions, enhancing the overall robustness of electronic systems.