Product Overview: 74AUP2G14GW,125 by NXP
The 74AUP2G14GW,125 is a high-performance, dual inverting Schmitt-trigger manufactured by NXP Semiconductors. This integrated circuit (IC) is part of NXP's advanced ultra-low-power (AUP) family, designed to operate with a very low-power consumption while maintaining excellent speed and performance characteristics.
Key Features
- Low Power Consumption: The 74AUP2G14GW,125 is optimized for low-voltage operation, ranging from 0.8V to 3.6V, making it ideal for battery-operated and power-sensitive applications.
- Dual Inverting Schmitt Trigger: The device contains two inverting Schmitt triggers, providing excellent noise immunity and hysteresis, which is crucial for transforming noisy input signals into clean digital outputs.
- High-Speed Operation: Despite its low-power design, the IC does not compromise on speed, offering fast propagation delays typically associated with higher power circuits.
- ESD Protection: The inputs are equipped with electrostatic discharge (ESD) protection circuitry, safeguarding the device from static damage during handling and operation.
- Leadless Package: The 74AUP2G14GW,125 comes in a leadless 6-pin TSSOP package (GW) which is both space-saving and suitable for high-density mounting on printed circuit boards (PCBs).
Applications
The versatility of the 74AUP2G14GW,125 allows it to be used in a wide array of electronic applications, including:
- Wave shaping and noise filtering
- Signal processing
- Logic level translation
- Power management systems
- Portable and battery-powered devices
Technical Specifications
| Parameter |
Value |
| Supply Voltage (VCC) |
0.8V to 3.6V |
| Input Voltage (VI) |
0V to 3.6V |
| Output Voltage (VO) |
0V to VCC |
| Temperature Range |
-40°C to +125°C |
| Package Type |
TSSOP6 (GW) |
With its combination of low-power operation, high-speed performance, and robust protection features, the 74AUP2G14GW,125 by NXP is an excellent choice for designers looking to optimize their digital logic circuits without sacrificing quality and reliability.