Microchip Technology SST39VF1682-70-4I-EKE Flash Memory

Introducing the SST39VF1682-70-4I-EKE, a high-performance CMOS Multi-Purpose Flash Plus (MPF+) memory device from the trusted brand Microchip Technology. Designed to offer reliability and flexibility, this flash memory is an ideal storage solution for a wide range of applications in the electronics industry.

Key Features

• Memory Size: This device boasts a memory size of 16 Mbit, providing ample space for firmware storage, boot code, and data logging.
• Speed: With an access time of 70 ns, it ensures swift read operations, making it suitable for applications requiring fast data retrieval.
• Interface Type: It features a Parallel interface, which allows for easy integration with microcontrollers and processors.
• Supply Voltage: Operating at a voltage range of 2.7V to 3.6V, the SST39VF1682-70-4I-EKE is optimized for low-power applications.
• Temperature Range: The industrial temperature range of -40°C to +85°C ensures stable operation under extreme conditions, making it robust for industrial applications.
• Packaging: Housed in a 48-LFBGA (Lead-Free Ball Grid Array) package, it provides a compact footprint and reliable connectivity for PCB mounting.
• Sector-Erase and Block-Erase Capabilities: The device features flexible erase capabilities, allowing specific sections of the memory to be erased, which is beneficial for efficient memory management.
• Endurance: High endurance levels are guaranteed with at least 100,000 erase and program cycles per sector, ensuring a long operational lifespan.

Applications

The SST39VF1682-70-4I-EKE is versatile and can be used in a variety of sectors, including:

• Embedded systems
• Telecommunication
• Networking hardware
• Industrial control systems
• Automotive electronics
• Consumer electronics

With its robust design and advanced features, the SST39VF1682-70-4I-EKE from Microchip Technology is a reliable choice for developers and engineers looking for a non-volatile memory solution that delivers both performance and durability.