Microchip Technology AT28C256-20UM/883 EEPROM
The AT28C256-20UM/883 is a high-performance, 256K (32K x 8) parallel EEPROM from Microchip Technology, specifically designed to meet the rigorous standards of military and aerospace applications. This device offers a 28-pin CerDIP package, ensuring reliable operation even under the most demanding conditions.
Key Features:
- Density: The device provides a storage capacity of 256 kilobits, organized as 32,768 words of 8 bits each, catering to systems that require a substantial amount of non-volatile memory.
- Access Time: With a fast access time of 200 ns, the AT28C256-20UM/883 allows quick data retrieval, making it suitable for high-speed microprocessor systems.
- Operating Temperature: It operates within a military temperature range of -55°C to +125°C, ensuring consistent performance in extreme environments.
- Power Consumption: The device features low power consumption with a typical active current of 30 mA and standby current of 1 μA, contributing to energy-efficient designs.
- Write Cycle Time: It boasts a fast write cycle time of 10 ms per byte/word, which includes an auto-erase function, simplifying the write operations.
- Endurance: The EEPROM offers an impressive endurance with 100,000 write cycles, ensuring a long operational life.
- Data Retention: Data retention is guaranteed for a minimum of 10 years, providing a reliable storage solution over time.
- Package: The CerDIP (Ceramic Dual In-line Package) provides a robust and reliable housing, suitable for military-grade applications.
Applications:
The AT28C256-20UM/883 is ideal for applications where high-density, non-volatile memory storage is crucial. This includes critical systems in aerospace, satellite communication, military hardware, and other sectors where data integrity and device reliability are paramount.
Quality and Reliability:
As part of Microchip Technology's commitment to quality, the AT28C256-20UM/883 is manufactured to meet stringent military specifications (MIL-STD-883), ensuring the highest levels of quality and reliability for mission-critical applications.