Product Overview: 74ABT16823 from NXP Semiconductors
The 74ABT16823 from NXP Semiconductors is a high-performance, 18-bit universal bus driver designed with advanced silicon-gate BiCMOS technology. This integrated circuit is a part of the ABT range of products known for their high-speed operation while maintaining the power dissipation levels of CMOS technology. It is specifically crafted to improve both the performance and density of three-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters.
Key Features
- High-Speed Operation: The 74ABT16823 is capable of operating at high speeds, with a typical output enable time of 4.5ns and a disable time of 5.5ns, ensuring swift data flow and processing.
- Low Power Dissipation: It is designed to consume low power, with an ICC of 40µA maximum, making it suitable for power-sensitive applications.
- Live Insertion and Extraction: This feature allows devices to be inserted or removed without powering down the system, minimizing downtime and facilitating easy maintenance and upgrades.
- Bus Hold Data Inputs: The inputs include a bus hold feature that eliminates the need for external pull-up or pull-down resistors, simplifying board design and reducing component count.
- Multiple VCC and GND Pins: These minimize the inductive effects of high current surges and provide improved stability and noise immunity.
Applications
The 74ABT16823 is a versatile component suitable for various applications, including:
- Memory address drivers
- Clock drivers
- Bus-oriented interfaces
- High-speed data paths
Technical Specifications
- Logic Type: Universal Bus Driver
- Number of Bits per Element: 18
- Number of Elements: 1
- Output Current: -32mA / 64mA
- Supply Voltage Range: 4.5V to 5.5V
- Operating Temperature Range: -40°C to +85°C
- Package: 56-Pin TSSOP
With its robust set of features and specifications, the NXP 74ABT16823 is an excellent choice for designers looking to optimize their high-speed digital interfaces while maintaining efficient power consumption and reliability.
